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ECE 6250. ASIC Design and Testing of VLSI Circuits. 3 Credits.

ASIC and mixed-signal design methodology, use of ASIC design CAD tools; logic synthesis, styles of synthesis, power/area/speed constraints; MIPS CPU HDL implementation/verification/testing; VLSI testing, fault models, design for testability techniques, scan path, built-in self-test. Chips designed and fabricated in ECE 4140 or ECE 6240 or equivalent course are tested. Prerequisites: ECE 4140 or ECE 6240.   (Spring, Every Year).