ECE 6250. ASIC Design and Testing of VLSI Circuits. 3 Credits.
ASIC and mixed-signal design methodology, use of ASIC design CAD tools; logic synthesis, styles of synthesis, power/area/speed constraints; MIPS CPU HDL implementation/verification/testing; VLSI testing, fault models, design for testability techniques, scan path, built-in self-test. Chips designed and fabricated in ECE 4140 or ECE 6240 or equivalent course are tested. Prerequisites: ECE 4140 or ECE 6240. (Spring, Every Year).